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| Artikel-Nr.:
5667A-9783031447334 Herst.-Nr.:
9783031447334 EAN/GTIN:
9783031447334 |
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| Theory and Applications Weitere Informationen: | | Author: | Raimund Ubar; Jaan Raik; Maksim Jenihhin; Artur Jutman | Verlag: | Springer International Publishing | Sprache: | eng |
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| Weitere Suchbegriffe: Datenbanken (Fachbücher), Datenbankenbücher, bücher für datenbanken - englischsprachig, Binary Decision Diagrams, Structural Decision Diagrams for Modeling Digital Circuits, Boolean Algebra Meets Graph-Theory, High-level Decision Diagrams for Modeling Digital Systems, Applications in Test Engineering, Parallel Fault Simulation with Critical Path Backtracing, Multi-valued Simulation for Hazard Detection in Digital Circuits, Test Group Generation for Detecting Multiple Faults, Avoiding Mutual Masking of Multiple Faults, Cross-level Modeling of Faults in Digital Systems, Hierarchical Multi-level Test Generation |
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