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| Artikel-Nr.: 5667A-9783319089935 Herst.-Nr.: 9783319089935 EAN/GTIN: 9783319089935 |
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| Hot Carrier Degradation in Semiconductor Devices Weitere Informationen: | | Author: | Tibor Grasser | Verlag: | Springer International Publishing | Sprache: | eng |
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| Weitere Suchbegriffe: allgemeine technikbücher - englischsprachig, Elektronik / Mikroelektronik, Mikroelektronik, DegradationofSemiconductorDevicePerformance; HotCarrierDegradation; ReliabilityPhysicsandEngineering; SemiconductorDeviceLifetime; SemiconductorDeviceReliability, Degradation of Semiconductor Device Performance, Hot Carrier Degradation, Reliability Physics and Engineering, Semiconductor Device Lifetime, Semiconductor Device Reliability |
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